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Beschreibung
Based on the authors' years of extensive experience, this is an authoritative overview of Wide Bandgap (WBG) device characterization. It provides essential tools to assist researchers, advanced students and practicing engineers in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power semiconductors. The book presents practical considerations for real applications, and includes examples of applying the described methodology.
Based on the authors' years of extensive experience, this is an authoritative overview of Wide Bandgap (WBG) device characterization. It provides essential tools to assist researchers, advanced students and practicing engineers in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power semiconductors. The book presents practical considerations for real applications, and includes examples of applying the described methodology.
Über den Autor

Fei (Fred) Wang is Professor of Electrical Engineering and Condra Chair of Excellence in Power Electronics, and Technical Director of NSF/DOE Engineering Research Center CURENT at The University of Tennessee, Knoxville, USA. He also holds a joint appointment with Oak Ridge National Lab. Prof. Wang has published over 400 journal and conference papers, authored 3 book chapters, and holds 15 US patents. He is a fellow of IEEE and NAI.

Inhaltsverzeichnis
  • Chapter 1: Introduction
  • Chapter 2: Pulsed static characterization
  • Chapter 3: Junction capacitance characterization
  • Chapter 4: Fundamentals of dynamic characterization
  • Chapter 5: Gate drive for dynamic characterization
  • Chapter 6: Layout design and parasitic management
  • Chapter 7: Protection design for double pulse test
  • Chapter 8: Measurement and data processing for dynamic characterization
  • Chapter 9: Cross-talk consideration
  • Chapter 10: Impact of three-phase system
  • Chapter 11: Topology consideration
  • Appendix A: Recommended equipment and components list for DPT setup
  • Appendix B: Data processing code for dynamic characterization
Details
Erscheinungsjahr: 2018
Fachbereich: Nachrichtentechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: Gebunden
ISBN-13: 9781785614910
ISBN-10: 1785614916
Sprache: Englisch
Einband: Gebunden
Autor: Wang, Fei
Zhang, Zheyu
Jones, Edward A
Hersteller: Institution of Engineering & Technology
Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, D-36244 Bad Hersfeld, gpsr@libri.de
Maße: 240 x 161 x 23 mm
Von/Mit: Fei Wang (u. a.)
Erscheinungsdatum: 31.10.2018
Gewicht: 0,689 kg
Artikel-ID: 112691915

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