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Applied Charged Particle Optics
Buch von Helmut Liebl
Sprache: Englisch

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Beschreibung
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Zusammenfassung

Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. The book begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. The book's wide frame of reference makes this an ideal work for researchers, engineers and graduate students alike.

Inhaltsverzeichnis
Lenses: Basic Optics.- Electrostatic Deflection.- Magnetic Deflection.- Image Aberrations.- Fringe Field Confinement.
Details
Erscheinungsjahr: 2007
Fachbereich: Astronomie
Genre: Physik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: x
131 S.
ISBN-13: 9783540719243
ISBN-10: 3540719245
Sprache: Englisch
Herstellernummer: 11903109
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Liebl, Helmut
Hersteller: Springer-Verlag GmbH
Springer Berlin Heidelberg
Maße: 241 x 160 x 13 mm
Von/Mit: Helmut Liebl
Erscheinungsdatum: 02.11.2007
Gewicht: 0,389 kg
Artikel-ID: 102057015
Zusammenfassung

Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. The book begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. The book's wide frame of reference makes this an ideal work for researchers, engineers and graduate students alike.

Inhaltsverzeichnis
Lenses: Basic Optics.- Electrostatic Deflection.- Magnetic Deflection.- Image Aberrations.- Fringe Field Confinement.
Details
Erscheinungsjahr: 2007
Fachbereich: Astronomie
Genre: Physik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Inhalt: x
131 S.
ISBN-13: 9783540719243
ISBN-10: 3540719245
Sprache: Englisch
Herstellernummer: 11903109
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Liebl, Helmut
Hersteller: Springer-Verlag GmbH
Springer Berlin Heidelberg
Maße: 241 x 160 x 13 mm
Von/Mit: Helmut Liebl
Erscheinungsdatum: 02.11.2007
Gewicht: 0,389 kg
Artikel-ID: 102057015
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