Transmission Electron Microscopy | Buch

Cover: 9783319266497 | Transmission Electron Microscopy | David B. Williams (u. a.) | Buch

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Beschreibung

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today¿s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging¿the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Über den Autor

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.

David B. Williams is the Monte Ahuja Endowed Dean's Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.

Zusammenfassung

An essential companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter

Equips the reader with a clear and deep understanding of TEM, the essential tool for studying nanomaterials

Presents advanced topics with the same look, feel, and approach that students already know from Williams & Carter

Features chapters on diffraction, high-resolution imaging, and chemical mapping by the leading experts in the field

Provides the fundamentals for students to understand and interpret the results of electron tomography and electron holography, even if they will not employ these techniques themselves

Includes supplementary material: [...]

Inhaltsverzeichnis

Foreword by Sir John Meurig Thomas.- 1. Electron Sources.- 2. In Situ and Operando.- 3. Electron Diffraction and Phase Identification.- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns.- 5. Electron crystallography, charge-density mapping and nanodiffraction.- 6. Digital Micrograph.- 7. Electron waves, interference & coherence.- 8. Electron Holography.- 9. Focal-Series Reconstruction.- 10. Direct Methods For Image Interpretation.- 11. Imaging in the STEM.- 12. Electron Tomography.- 13. Energy-Filtered Transmission Electron Microscopy.- 14. Calculation of Electron Energy-Loss Spectra.- 15. Electron Diffraction & X-Ray Excitation.- 16. X-Ray and Electron Energy-Loss Spectral Imaging.- 17. Practical Aspects and Advanced Applications of XEDS.

Details

Erscheinungsjahr:	2016
Fachbereich:	Fertigungstechnik
Genre:	Mathematik , Medizin , Naturwissenschaften , Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Buch
Inhalt:	xxxiii 518 S. 300 s/w Illustr. 518 p. 300 illus.
ISBN-13:	9783319266497
ISBN-10:	3319266497
Sprache:	Englisch
Herstellernummer:	978-3-319-26649-7
Ausstattung / Beilage:	HC runder Rücken kaschiert
Einband:	Gebunden
Autor:	Carter, C. Barry Williams, David B.
Redaktion:	Williams, David B. Carter, C. Barry
Herausgeber:	C Barry Carter/David B Williams
Auflage:	1st ed. 2016
Hersteller:	Springer Nature Switzerland Springer International Publishing Springer International Publishing AG
Maße:	285 x 215 x 34 mm
Von/Mit:	David B. Williams (u. a.)
Erscheinungsdatum:	05.09.2016
Gewicht:	1,744 kg

Artikel-ID: 104172252