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A powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data, the Rietveld method attracts a great deal of interest from researchers in physics, chemistry, materials science, and crystallography. Now available in paperback, this book comprises chapters from international researchers on all aspects of this important technique. It will be of great interest to all researchers in the fields, as well as graduate students seeking a solid introduction and comprehensive survey.
A powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data, the Rietveld method attracts a great deal of interest from researchers in physics, chemistry, materials science, and crystallography. Now available in paperback, this book comprises chapters from international researchers on all aspects of this important technique. It will be of great interest to all researchers in the fields, as well as graduate students seeking a solid introduction and comprehensive survey.
Inhaltsverzeichnis
- Introduction to the Rietveld Method
- 1: H.M. Rietveld: The early days: a retrospective view
- 2: E. Prince: Mathematical aspects of Rietveld refinement
- 3: T.M. Sabine: The flow of radiation in a polycrystalline material
- 4: R.J. Hill: Data collection strategies: fitting the experiment to the need
- 5: J.W. Richardson Jr: Background modelling in Rietveld analysis
- 6: R.L. Snyder: Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis
- 7: R. Delhez, Th H. de Keijser, J.I. Langford, D. Louër, E.J. Mittemeijer, and E.J. Sonneveld: Crystal imperfection broadening and peak shape in the Rietveld method
- 8: P. Suortti: Bragg reflection profile shape in X-ray powder diffraction patterns
- 9: C. Bärlocher: Restraints and constraints in Rietveld refinement
- 10: W.I.F. David, J.D. Jorgensen: Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources
- 11: R.B. von Dreele: Combined X-ray and neutron Rietveld refinement
- 12: F. Izumi: Rietveld analysis programs Rietan and Premos and special applications
- 13: H. Toraya: Position - constrained and unconstrained powder-pattern-decomposition methods
- 14: A.K. Cheetham: Ab initio structure solutions with powder diffraction data
Details
| Erscheinungsjahr: | 1995 |
|---|---|
| Genre: | Technik allg. |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| ISBN-13: | 9780198559122 |
| ISBN-10: | 0198559127 |
| Sprache: | Englisch |
| Ausstattung / Beilage: | Paperback |
| Einband: | Kartoniert / Broschiert |
| Redaktion: | Young, R. A. |
| Hersteller: | OUP Oxford |
| Maße: | 234 x 156 x 17 mm |
| Von/Mit: | R. A. Young |
| Erscheinungsdatum: | 19.01.1995 |
| Gewicht: | 0,477 kg |
Inhaltsverzeichnis
- Introduction to the Rietveld Method
- 1: H.M. Rietveld: The early days: a retrospective view
- 2: E. Prince: Mathematical aspects of Rietveld refinement
- 3: T.M. Sabine: The flow of radiation in a polycrystalline material
- 4: R.J. Hill: Data collection strategies: fitting the experiment to the need
- 5: J.W. Richardson Jr: Background modelling in Rietveld analysis
- 6: R.L. Snyder: Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis
- 7: R. Delhez, Th H. de Keijser, J.I. Langford, D. Louër, E.J. Mittemeijer, and E.J. Sonneveld: Crystal imperfection broadening and peak shape in the Rietveld method
- 8: P. Suortti: Bragg reflection profile shape in X-ray powder diffraction patterns
- 9: C. Bärlocher: Restraints and constraints in Rietveld refinement
- 10: W.I.F. David, J.D. Jorgensen: Rietveld refinement with time-of-flight powder diffraction data from pulsed neutron sources
- 11: R.B. von Dreele: Combined X-ray and neutron Rietveld refinement
- 12: F. Izumi: Rietveld analysis programs Rietan and Premos and special applications
- 13: H. Toraya: Position - constrained and unconstrained powder-pattern-decomposition methods
- 14: A.K. Cheetham: Ab initio structure solutions with powder diffraction data
Details
| Erscheinungsjahr: | 1995 |
|---|---|
| Genre: | Technik allg. |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| ISBN-13: | 9780198559122 |
| ISBN-10: | 0198559127 |
| Sprache: | Englisch |
| Ausstattung / Beilage: | Paperback |
| Einband: | Kartoniert / Broschiert |
| Redaktion: | Young, R. A. |
| Hersteller: | OUP Oxford |
| Maße: | 234 x 156 x 17 mm |
| Von/Mit: | R. A. Young |
| Erscheinungsdatum: | 19.01.1995 |
| Gewicht: | 0,477 kg |
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