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Dr. Vladislav Vashchenko is Director of ESD group at Maxim Integrated Corp responsible for major ESD development aspects across the entire [...]B enterprise. During previous decade he was leading the ESD group at National Semiconductor Corp. and the decade till then he was a key contributor in reliability department of SRI "Pulsar"(Moscow). He received MS, Engineer-Physicist and "Ph.D. in Physics of Semiconductors" from Moscow Institute of Physics and Technology (1990) and "Doctor of Science in Microelectronics" degree (1997). He is author of over 140 U.S. patents and over 100 papers in the field, co-author of books "Physical Limitation of Semiconductor Devices" (2008) and "ESD Design for Analog Circuits" (2010,).
Mirko Scholz received the degree "Diplomingenieur (FH)" from the University of Applied Sciences in Zwickau (Germany) in 2005 and the PhD degree in Electrical Engineering from the Vrije Universiteit in Brussels (VUB) in 2013. In April 2005 he joined the imec ESD team as ESD researcher where he authored and coauthored more than 70 publications, tutorials and patents in the field of ESD reliability and ESD testing. Since 2007, he has been a member of the Device Testing Working Groups of the ESDA standards committee where he currently chairs working group 5.6 (Human Metal Model).
Provides a systematic approach to on-chip ESD protection for system-level IC pins
Describes a system-level co-design methodology, which uses external system level ESD protection components, together with on-chip ESD protection structure
Includes a comprehensive description of wafer- level and component-level test methodologies
Includes supplementary material: [...]
System 1 Level ESD design.- System Level Test Methods.- On-Chip System Level ESD Devices and Clamps.- Latch-up at System-Level Stress.- IC and Systemn ESD Co-Design.
| Erscheinungsjahr: | 2014 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Buch |
| Inhalt: |
xviii
320 S. 283 s/w Illustr. 12 farbige Illustr. 320 p. 295 illus. 12 illus. in color. |
| ISBN-13: | 9783319032207 |
| ISBN-10: | 3319032208 |
| Sprache: | Englisch |
| Einband: | Gebunden |
| Autor: |
Scholz, Mirko
Vashchenko, Vladislav |
| Hersteller: |
Springer International Publishing
Springer International Publishing AG |
| Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
| Maße: | 241 x 160 x 24 mm |
| Von/Mit: | Mirko Scholz (u. a.) |
| Erscheinungsdatum: | 03.04.2014 |
| Gewicht: | 0,676 kg |
Dr. Vladislav Vashchenko is Director of ESD group at Maxim Integrated Corp responsible for major ESD development aspects across the entire [...]B enterprise. During previous decade he was leading the ESD group at National Semiconductor Corp. and the decade till then he was a key contributor in reliability department of SRI "Pulsar"(Moscow). He received MS, Engineer-Physicist and "Ph.D. in Physics of Semiconductors" from Moscow Institute of Physics and Technology (1990) and "Doctor of Science in Microelectronics" degree (1997). He is author of over 140 U.S. patents and over 100 papers in the field, co-author of books "Physical Limitation of Semiconductor Devices" (2008) and "ESD Design for Analog Circuits" (2010,).
Mirko Scholz received the degree "Diplomingenieur (FH)" from the University of Applied Sciences in Zwickau (Germany) in 2005 and the PhD degree in Electrical Engineering from the Vrije Universiteit in Brussels (VUB) in 2013. In April 2005 he joined the imec ESD team as ESD researcher where he authored and coauthored more than 70 publications, tutorials and patents in the field of ESD reliability and ESD testing. Since 2007, he has been a member of the Device Testing Working Groups of the ESDA standards committee where he currently chairs working group 5.6 (Human Metal Model).
Provides a systematic approach to on-chip ESD protection for system-level IC pins
Describes a system-level co-design methodology, which uses external system level ESD protection components, together with on-chip ESD protection structure
Includes a comprehensive description of wafer- level and component-level test methodologies
Includes supplementary material: [...]
System 1 Level ESD design.- System Level Test Methods.- On-Chip System Level ESD Devices and Clamps.- Latch-up at System-Level Stress.- IC and Systemn ESD Co-Design.
| Erscheinungsjahr: | 2014 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Mathematik, Medizin, Naturwissenschaften, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Buch |
| Inhalt: |
xviii
320 S. 283 s/w Illustr. 12 farbige Illustr. 320 p. 295 illus. 12 illus. in color. |
| ISBN-13: | 9783319032207 |
| ISBN-10: | 3319032208 |
| Sprache: | Englisch |
| Einband: | Gebunden |
| Autor: |
Scholz, Mirko
Vashchenko, Vladislav |
| Hersteller: |
Springer International Publishing
Springer International Publishing AG |
| Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
| Maße: | 241 x 160 x 24 mm |
| Von/Mit: | Mirko Scholz (u. a.) |
| Erscheinungsdatum: | 03.04.2014 |
| Gewicht: | 0,676 kg |
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