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Scanning Probe Microscopy
Atomic Force Microscopy and Scanning Tunneling Microscopy
Buch von Bert Voigtländer
Sprache: Englisch

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Beschreibung
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Über den Autor

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Zusammenfassung

Presents the state-of-the-art in scanning probe techniques

Combines basic physical principles and their application to scanning tunneling and atomic force microscopes

Useful study text for graduate students and also useful reference to researchers

Includes supplementary material: [...]

Inhaltsverzeichnis
Introduction.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy.- Surface States.- Forces Between Tip and Sample.- Technical Aspects of Atomic force Microscopy (AFM).- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance Curves.- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic force Microscopy.- Scanning Tunneling Microscopy.- Scanning Tunneling Spectroscopy (STS).- Vibrational Spectroscopy with the STM.- Spectroscopy and Imaging of Surface States.- Building Nanostructures Atom by Atom.
Details
Erscheinungsjahr: 2015
Fachbereich: Allgemeines
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Seiten: 400
Reihe: NanoScience and Technology
Inhalt: xv
382 S.
41 s/w Illustr.
148 farbige Illustr.
382 p. 189 illus.
148 illus. in color.
ISBN-13: 9783662452394
ISBN-10: 3662452391
Sprache: Englisch
Herstellernummer: 12672608
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Voigtländer, Bert
Auflage: 2015
Hersteller: Springer-Verlag GmbH
Springer Berlin Heidelberg
NanoScience and Technology
Maße: 241 x 160 x 27 mm
Von/Mit: Bert Voigtländer
Erscheinungsdatum: 23.03.2015
Gewicht: 0,764 kg
preigu-id: 105067487
Über den Autor

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Zusammenfassung

Presents the state-of-the-art in scanning probe techniques

Combines basic physical principles and their application to scanning tunneling and atomic force microscopes

Useful study text for graduate students and also useful reference to researchers

Includes supplementary material: [...]

Inhaltsverzeichnis
Introduction.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy.- Surface States.- Forces Between Tip and Sample.- Technical Aspects of Atomic force Microscopy (AFM).- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance Curves.- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic force Microscopy.- Scanning Tunneling Microscopy.- Scanning Tunneling Spectroscopy (STS).- Vibrational Spectroscopy with the STM.- Spectroscopy and Imaging of Surface States.- Building Nanostructures Atom by Atom.
Details
Erscheinungsjahr: 2015
Fachbereich: Allgemeines
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Seiten: 400
Reihe: NanoScience and Technology
Inhalt: xv
382 S.
41 s/w Illustr.
148 farbige Illustr.
382 p. 189 illus.
148 illus. in color.
ISBN-13: 9783662452394
ISBN-10: 3662452391
Sprache: Englisch
Herstellernummer: 12672608
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Voigtländer, Bert
Auflage: 2015
Hersteller: Springer-Verlag GmbH
Springer Berlin Heidelberg
NanoScience and Technology
Maße: 241 x 160 x 27 mm
Von/Mit: Bert Voigtländer
Erscheinungsdatum: 23.03.2015
Gewicht: 0,764 kg
preigu-id: 105067487
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