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Cover: 9783540431800 | Scanning Probe Microscopy | The Lab on a Tip | Ernst Meyer (u. a.)
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Scanning Probe Microscopy
The Lab on a Tip
Buch von Ernst Meyer (u. a.)
Sprache: Englisch

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Beschreibung
Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor­ age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi­ ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques­ tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen­ eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora­ tory.
Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor­ age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi­ ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques­ tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen­ eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora­ tory.
Zusammenfassung

Written by three leading experts in the field, this textbook describes and explains all aspects of scanning probe microscopy, i.e. scanning tunneling microscopy, scanning force microscopy, magnetic force microscopy, and related imaging techniques with atomic-scale resolution. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Novel applications and the latest important results are also presented. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Inhaltsverzeichnis
1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.
Details
Erscheinungsjahr: 2003
Fachbereich: Elektrizität/Magnetismus/Optik
Genre: Physik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Seiten: 224
Reihe: Advanced Texts in Physics
Inhalt: x
210 S.
189 s/w Illustr.
15 farbige Illustr.
210 p. 204 illus.
15 illus. in color.
ISBN-13: 9783540431800
ISBN-10: 3540431802
Sprache: Englisch
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Meyer, Ernst
Bennewitz, Roland
Hug, Hans Josef
Auflage: 2004
Hersteller: Springer Berlin
Springer Berlin Heidelberg
Advanced Texts in Physics
Maße: 241 x 160 x 20 mm
Von/Mit: Ernst Meyer (u. a.)
Erscheinungsdatum: 27.08.2003
Gewicht: 0,547 kg
preigu-id: 102520247
Zusammenfassung

Written by three leading experts in the field, this textbook describes and explains all aspects of scanning probe microscopy, i.e. scanning tunneling microscopy, scanning force microscopy, magnetic force microscopy, and related imaging techniques with atomic-scale resolution. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Novel applications and the latest important results are also presented. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Inhaltsverzeichnis
1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.
Details
Erscheinungsjahr: 2003
Fachbereich: Elektrizität/Magnetismus/Optik
Genre: Physik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Seiten: 224
Reihe: Advanced Texts in Physics
Inhalt: x
210 S.
189 s/w Illustr.
15 farbige Illustr.
210 p. 204 illus.
15 illus. in color.
ISBN-13: 9783540431800
ISBN-10: 3540431802
Sprache: Englisch
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Autor: Meyer, Ernst
Bennewitz, Roland
Hug, Hans Josef
Auflage: 2004
Hersteller: Springer Berlin
Springer Berlin Heidelberg
Advanced Texts in Physics
Maße: 241 x 160 x 20 mm
Von/Mit: Ernst Meyer (u. a.)
Erscheinungsdatum: 27.08.2003
Gewicht: 0,547 kg
preigu-id: 102520247
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