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Cover: 9780120885749 | Reliability and Failure of Electronic Materials and Devices | Buch
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Reliability and Failure of Electronic Materials and Devices
Taschenbuch von Milton Ohring (u. a.)
Sprache: Englisch

134,95 €*

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Beschreibung
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices.
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices.
Inhaltsverzeichnis
1. An Overview of Electronic Devices and Their Reliability
2. Electronic Devices: Materials Properties Determine How They Operate and Are Fabricated
3. Defects, Contamination and Yield
4. The Mathematics of Failure and Reliability
5. Mass Transport-Induced Failure
6. Electronic Charge-Induced Damage
7. Environmental Damage to Electronic Products
8. Packaging Materials, Processes, and Stresses
9. Degradation of Contacts and Packages
10. Degradation and Failure of Electro-Optical and Magnetic Materials and Devices
11. Characterization and Failure Analysis of Material, Devices and Packages
12. Future Directions and Reliability Issues
Details
Erscheinungsjahr: 2010
Fachbereich: Nachrichtentechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: Gebunden
ISBN-13: 9780120885749
ISBN-10: 0120885743
Sprache: Englisch
Herstellernummer: C2009-0-05748-1
Autor: Ohring, Milton
Kasprzak, Lucian
Auflage: 2. Aufl.
Hersteller: Academic Press
Verantwortliche Person für die EU: preigu, Ansas Meyer, Lengericher Landstr. 19, D-49078 Osnabrück, mail@preigu.de
Maße: 38 x 152 x 229 mm
Von/Mit: Milton Ohring (u. a.)
Erscheinungsdatum: 23.10.2014
Gewicht: 1,194 kg
Artikel-ID: 126688437
Inhaltsverzeichnis
1. An Overview of Electronic Devices and Their Reliability
2. Electronic Devices: Materials Properties Determine How They Operate and Are Fabricated
3. Defects, Contamination and Yield
4. The Mathematics of Failure and Reliability
5. Mass Transport-Induced Failure
6. Electronic Charge-Induced Damage
7. Environmental Damage to Electronic Products
8. Packaging Materials, Processes, and Stresses
9. Degradation of Contacts and Packages
10. Degradation and Failure of Electro-Optical and Magnetic Materials and Devices
11. Characterization and Failure Analysis of Material, Devices and Packages
12. Future Directions and Reliability Issues
Details
Erscheinungsjahr: 2010
Fachbereich: Nachrichtentechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: Gebunden
ISBN-13: 9780120885749
ISBN-10: 0120885743
Sprache: Englisch
Herstellernummer: C2009-0-05748-1
Autor: Ohring, Milton
Kasprzak, Lucian
Auflage: 2. Aufl.
Hersteller: Academic Press
Verantwortliche Person für die EU: preigu, Ansas Meyer, Lengericher Landstr. 19, D-49078 Osnabrück, mail@preigu.de
Maße: 38 x 152 x 229 mm
Von/Mit: Milton Ohring (u. a.)
Erscheinungsdatum: 23.10.2014
Gewicht: 1,194 kg
Artikel-ID: 126688437
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