Quantum Metrology, Imaging, and Communication

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Sprache: Englisch

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Beschreibung

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Über den Autor

David Simon. Professor, Stonehill College, Easton MA 02357, USA

Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA

Alexander V. Sergienko, Boston University, Boston MA 02215, USA

Zusammenfassung

Ideal introduction to the basics and applications of quantum optics

Presents and explains new techniques that are driving the field forwards

Author's combined expertise allows a comprehensive coverage of all aspects, experimental and theoretical

Includes supplementary material: [...]

Inhaltsverzeichnis

Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.

Details

Erscheinungsjahr:	2016
Fachbereich:	Theoretische Physik
Genre:	Mathematik , Medizin , Naturwissenschaften , Physik , Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Buch
Inhalt:	xii 273 S. 37 s/w Illustr. 68 farbige Illustr. 273 p. 105 illus. 68 illus. in color.
ISBN-13:	9783319465494
ISBN-10:	331946549X
Sprache:	Englisch
Einband:	Gebunden
Autor:	Simon, David S. Sergienko, Alexander V. Jaeger, Gregg
Auflage:	1st edition 2017
Hersteller:	Springer International Publishing
Verantwortliche Person für die EU:	Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße:	241 x 160 x 22 mm
Von/Mit:	David S. Simon (u. a.)
Erscheinungsdatum:	08.12.2016
Gewicht:	0,6 kg