Robert (Rob) Thomas is the Principal Scientist at Scientific Solutions, a consulting company that serves the educational needs of the trace element analysis user community. He has worked in the field of atomic and mass spectroscopy for almost 50 years, including 24 years for a manufacturer of atomic spectroscopic instrumentation. He has served on the American Chemical Society (ACS) Committee on Analytical Reagents (CAR) for the past 20 years as leader of the plasma spectrochemistry, heavy metals task force, where he has worked very closely with the United States Pharmacopeia (USP) to align ACS heavy metal testing procedures with pharmaceutical guidelines. Rob has written over 100 technical publications, including a 15-part tutorial series on ICP-MS. He is also the editor of and frequent contributor to the Atomic Perspectives column in Spectroscopy magazine, as well as serving on the editorial advisory board of Analytical Cannabis. In addition, Rob has authored five textbooks on the fundamental principles and applications of ICP-MS. Prior to this new edition of Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques, his most recent book was a paperback version of Measuring Heavy Metal Contaminants in Cannabis and Hemp, published in December 2021. Rob has an advanced degree in analytical chemistry from the University of Wales, UK, and is also a fellow of the Royal Society of Chemistry (FRSC) and a Chartered Chemist (CChem).

Contents

Foreword

Preface

Acknowledgements

Author Bio

Chapter 1: An Overview of ICP Mass Spectrometry

Chapter 2: Principles of Ion Formation

Chapter 3: Sample Introduction

Chapter 4: Plasma Source

Chapter 5: Interface Region

Chapter 6: Ion Focusing System

Chapter 7: Mass Analyzers: Quadrupole Technology

Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology

Chapter 9: Mass Analyzers: Time-Of-Flight Technology

Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface Technology

Chapter 11: Ion Detection

Chapter 12: Peak Measurement Protocol

Chapter 13: Methods of Quantitation

Chapter 14: Review of Interferences

Chapter 15: Routine Maintenance

Chapter 16: Sampling and Sample Preparation Procedures

Chapter 17: Reducing Errors from Contamination

Chapter 18: Alternative Sampling Accessories

Chapter 19: Trace Element Speciation Techniques

Chapter 20: The ICP-MS Application Landscape

Chapter 21: Fundamental Principles and Applications of Atomic Absorption/Fluorescence

Chapter 22: Fundamental Principles and Applications of ICP Optical Emission Spectrometry

Chapter 23: Fundamental Principles of Applications of Other Atomic Spectroscopic Techniques

• X Ray Analytical Techniques (XRF/XRD)
• Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
• Laser Induced Breakdown Spectrometry (LIBS)
• Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry (LALI-TOF-MS)

Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques

Chapter 25: Cost of Analysis of AS Techniques

Chapter 26: How to Select an ICP-MS: Some Important Analytical Considerations

Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)

Chapter 28: Useful Contact Information