Modern Techniques for Characterizing Magne...

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Beschreibung

Modern Techniques for Characterizing Magnetic Materials provides an extensive overview of novel characterization tools for magnetic materials including neutron, photon and electron scatterings and other microscopy techniques by world-renowned scientists. This interdisciplinary reference describes all available techniques to characterize and to understand magnetic materials, techniques that cover a wide range of length scales and belong to different scientific communities. The diverse contributions enhance cross-discipline communication, while also identifying both the drawbacks and advantages of different techniques, which can result in deriving effective combinations of techniques that are especially fruitful at nanometer scales. It will be a valuable resource for all graduate students, researchers, engineers and scientists who are interested in magnetic materials including their crystal structure, electronic structure, magnetization dynamics and their associated magnetic properties and underlying magnetism.

Zusammenfassung

Describes all available techniques to characterize and to understand magnetic materials

Interdisciplinary approach treating techniques that cover a wide range of length scales and belong to different scientific communities that have little cross-discipline communication

Valuable reference for all researchers who are interested in magnetic materials including their crystal structure, electronic structure, magnetization dynamics and their associated magnetic properties and underlying magnetism

Comprehensive and practical treatment of the subject

Inhaltsverzeichnis

Neutron Scattering.- Magnetic neutron scattering.- Small-angle neutron scattering.- Application of polarized neutron reflectometry to studies of artificially structured magnetic materials.- X-ray Scattering.- Resonant soft x-ray techniques to resolve nanoscale magnetism.- Hard x-ray resonant techniques for studies of nanomagnetism.- Spin-resolved photoemission studies of magnetic films.- Electron Scattering.- Magnetic phase imaging with transmission electron microscopy.- Spin-polarized scanning electron microscopy.- Spin-polarized low energy electron microscopy (SPLEEM).- Proximal Probe.- Spin-polarized scanning tunneling microscopy.- Magnetic force microscopy.- Light Scattering.- Scanning near-field magneto-optic microscopy.- Magnetization dynamics using time-resolved magneto-optic microscopy.- Brillouin light scattering spectroscopy.

Details

Erscheinungsjahr:	2005
Fachbereich:	Technik allgemein
Genre:	Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Buch
Inhalt:	xx 600 S. 407 s/w Illustr. 53 farbige Illustr. 600 p. 460 illus. 53 illus. in color.
ISBN-13:	9781402080074
ISBN-10:	1402080077
Sprache:	Englisch
Herstellernummer:	11052838
Ausstattung / Beilage:	HC runder Rücken kaschiert
Einband:	Gebunden
Redaktion:	Zhu, Yimei
Herausgeber:	Yimei Zhu
Hersteller:	Springer US Springer US, New York, N.Y.
Maße:	260 x 183 x 44 mm
Von/Mit:	Yimei Zhu
Erscheinungsdatum:	20.04.2005
Gewicht:	1,544 kg

Artikel-ID: 102283578