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Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;
Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;
Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;
Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;
Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
In recent years, Prof. Henkel has given more than ten keynotes at various international conferences primarily with focus on embedded systems dependability. He has given full/half-day tutorials at leading conferences like DAC, ICCAD, DATE etc. Prof. Henkel received the 2008 DATE Best Paper Award, the 2009 IEEE/ACM William J. Mc Calla ICCAD Best Paper Award, the Codes+ISSS 2015, 2014, and 2011 Best Paper Awards, and the MaXentric Technologies AHS 2011 Best Paper Award as well as the DATE 2013 Best IP Award and the DAC 2014 Designer Track Best Poster Award. He is the Chairman of the IEEE Computer Society, Germany Section, and was the Editor-in-Chief of the ACM Transactions on Embedded Computing Systems (ACM TECS) for two consecutive terms. He is an initiator and the coordinator of the German Research Foundation's (DFG) program on 'Dependable Embedded Systems' (SPP 1500). He is the site coordinator (Karlsruhe site) of the Three-University Collaborative Research Center on "Invasive Computing" (DFG TR89). He is the Editor-in-Chief of the IEEE Design&Test Magazine. He holds ten US patents and is a Fellow of the IEEE.
Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems
Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers
Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems
Erscheinungsjahr: | 2020 |
---|---|
Fachbereich: | Nachrichtentechnik |
Genre: | Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Buch |
Reihe: | Embedded Systems |
Inhalt: |
xiii
608 S. 43 s/w Illustr. 250 farbige Illustr. 608 p. 293 illus. 250 illus. in color. |
ISBN-13: | 9783030520168 |
ISBN-10: | 3030520161 |
Sprache: | Englisch |
Ausstattung / Beilage: | HC runder Rücken kaschiert |
Einband: | Gebunden |
Redaktion: |
Dutt, Nikil
Henkel, Jörg |
Herausgeber: | Jörg Henkel/Nikil Dutt |
Auflage: | 1st ed. 2021 |
Hersteller: |
Springer International Publishing
Embedded Systems |
Maße: | 241 x 160 x 39 mm |
Von/Mit: | Nikil Dutt (u. a.) |
Erscheinungsdatum: | 10.12.2020 |
Gewicht: | 1,092 kg |
In recent years, Prof. Henkel has given more than ten keynotes at various international conferences primarily with focus on embedded systems dependability. He has given full/half-day tutorials at leading conferences like DAC, ICCAD, DATE etc. Prof. Henkel received the 2008 DATE Best Paper Award, the 2009 IEEE/ACM William J. Mc Calla ICCAD Best Paper Award, the Codes+ISSS 2015, 2014, and 2011 Best Paper Awards, and the MaXentric Technologies AHS 2011 Best Paper Award as well as the DATE 2013 Best IP Award and the DAC 2014 Designer Track Best Poster Award. He is the Chairman of the IEEE Computer Society, Germany Section, and was the Editor-in-Chief of the ACM Transactions on Embedded Computing Systems (ACM TECS) for two consecutive terms. He is an initiator and the coordinator of the German Research Foundation's (DFG) program on 'Dependable Embedded Systems' (SPP 1500). He is the site coordinator (Karlsruhe site) of the Three-University Collaborative Research Center on "Invasive Computing" (DFG TR89). He is the Editor-in-Chief of the IEEE Design&Test Magazine. He holds ten US patents and is a Fellow of the IEEE.
Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems
Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers
Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems
Erscheinungsjahr: | 2020 |
---|---|
Fachbereich: | Nachrichtentechnik |
Genre: | Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Buch |
Reihe: | Embedded Systems |
Inhalt: |
xiii
608 S. 43 s/w Illustr. 250 farbige Illustr. 608 p. 293 illus. 250 illus. in color. |
ISBN-13: | 9783030520168 |
ISBN-10: | 3030520161 |
Sprache: | Englisch |
Ausstattung / Beilage: | HC runder Rücken kaschiert |
Einband: | Gebunden |
Redaktion: |
Dutt, Nikil
Henkel, Jörg |
Herausgeber: | Jörg Henkel/Nikil Dutt |
Auflage: | 1st ed. 2021 |
Hersteller: |
Springer International Publishing
Embedded Systems |
Maße: | 241 x 160 x 39 mm |
Von/Mit: | Nikil Dutt (u. a.) |
Erscheinungsdatum: | 10.12.2020 |
Gewicht: | 1,092 kg |