Bayesian and Frequentist Regression Methods

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Sprache: Englisch

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Beschreibung

Bayesian and Frequentist Regression Methods provides a modern account of both Bayesian and frequentist methods of regression analysis. Many texts cover one or the other of the approaches, but this is the most comprehensive combination of Bayesian and frequentist methods that exists in one place.

The two philosophical approaches to regression methodology are featured here as complementary techniques, with theory and data analysis providing supplementary components of the discussion. In particular, methods are illustrated using a variety of data sets. The majority of the data sets are drawn from biostatistics but the techniques are generalizable to a wide range of other disciplines.

Über den Autor

Jon Wakefield is Professor in the Departments of Statistics and Biostatistics at the University of Washington. His interests lie in biostatistics, epidemiology and genetics and in links between frequentist and Bayesian methods. His work has been published extensively. He received his PhD from the University of Nottingham, and his honors include the Guy Medal in Bronze from the Royal Statistical Society, and he is a Fellow of the American Statistical Association. He has previously been the Chair of the Department of Statistics at the University of Washington.

Zusammenfassung

This book provides a balanced, modern summary of Bayesian and frequentist methods for regression analysis.

Inhaltsverzeichnis

Introduction.- Frequentist Inference.- Bayesian Inference.- Linear Models.- Binary Data Models.- General Regression Models.

Details

Erscheinungsjahr:	2016
Fachbereich:	Wahrscheinlichkeitstheorie
Genre:	Mathematik
Rubrik:	Naturwissenschaften & Technik
Medium:	Taschenbuch
Reihe:	Springer Series in Statistics
Inhalt:	xix 697 S.
ISBN-13:	9781493938629
ISBN-10:	1493938622
Sprache:	Englisch
Ausstattung / Beilage:	Paperback
Einband:	Kartoniert / Broschiert
Autor:	Wakefield, Jon
Auflage:	Softcover reprint of the original 1st ed. 2013
Hersteller:	Springer New York Springer US, New York, N.Y. Springer Series in Statistics
Maße:	235 x 155 x 39 mm
Von/Mit:	Jon Wakefield
Erscheinungsdatum:	23.08.2016
Gewicht:	1,072 kg