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Applied Scanning Probe Methods V
Scanning Probe Microscopy Techniques
Buch von Bharat Bhushan (u. a.)
Sprache: Englisch

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Beschreibung
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Zusammenfassung
Title is also available as part of a set: Applied Scanning Probe Methods (978-3-540-88823-9)
Inhaltsverzeichnis
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.
Details
Erscheinungsjahr: 2006
Fachbereich: Allgemeines
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Seiten: 392
Reihe: NanoScience and Technology
Inhalt: xlv
344 S.
ISBN-13: 9783540373155
ISBN-10: 3540373152
Sprache: Englisch
Herstellernummer: 11429609
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Redaktion: Bhushan, Bharat
Kawata, Satoshi
Fuchs, Harald
Herausgeber: Bharat Bhushan/Harald Fuchs/Satoshi Kawata
Auflage: 2007
Hersteller: Springer Berlin
Springer Berlin Heidelberg
NanoScience and Technology
Maße: 241 x 160 x 27 mm
Von/Mit: Bharat Bhushan (u. a.)
Erscheinungsdatum: 18.10.2006
Gewicht: 0,752 kg
preigu-id: 112012201
Zusammenfassung
Title is also available as part of a set: Applied Scanning Probe Methods (978-3-540-88823-9)
Inhaltsverzeichnis
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.
Details
Erscheinungsjahr: 2006
Fachbereich: Allgemeines
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Seiten: 392
Reihe: NanoScience and Technology
Inhalt: xlv
344 S.
ISBN-13: 9783540373155
ISBN-10: 3540373152
Sprache: Englisch
Herstellernummer: 11429609
Ausstattung / Beilage: HC runder Rücken kaschiert
Einband: Gebunden
Redaktion: Bhushan, Bharat
Kawata, Satoshi
Fuchs, Harald
Herausgeber: Bharat Bhushan/Harald Fuchs/Satoshi Kawata
Auflage: 2007
Hersteller: Springer Berlin
Springer Berlin Heidelberg
NanoScience and Technology
Maße: 241 x 160 x 27 mm
Von/Mit: Bharat Bhushan (u. a.)
Erscheinungsdatum: 18.10.2006
Gewicht: 0,752 kg
preigu-id: 112012201
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