A Probabilistic Theory of Pattern Recognition

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Beschreibung

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.

Zusammenfassung

Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.

Inhaltsverzeichnis

Preface * Introduction * The Bayes Error * Inequalities and alternate
distance measures * Linear discrimination * Nearest neighbor rules *
Consistency * Slow rates of convergence Error estimation * The regular
histogram rule * Kernel rules Consistency of the k-nearest neighbor
rule * Vapnik-Chervonenkis theory * Combinatorial aspects of Vapnik-
Chervonenkis theory * Lower bounds for empirical classifier selection
* The maximum likelihood principle * Parametric classification *
Generalized linear discrimination * Complexity regularization *
Condensed and edited nearest neighbor rules * Tree classifiers * Data-
dependent partitioning * Splitting the data * The resubstitution
estimate * Deleted estimates of the error probability * Automatic
kernel rules * Automatic nearest neighbor rules * Hypercubes and
discrete spaces * Epsilon entropy and totally bounded sets * Uniform
laws of large numbers * Neural networks * Other error estimates *
Feature extraction * Appendix * Notation * References * Index

Erscheinungsjahr:	1996
Medium:	Buch
Reihe:	Stochastic Modelling and Applied Probability
Inhalt:	xv 638 S.
ISBN-13:	9780387946184
ISBN-10:	0387946187
Sprache:	Englisch
Ausstattung / Beilage:	HC runder Rücken kaschiert
Einband:	Gebunden
Autor:	Devroye, Luc Lugosi, Gabor Györfi, Laszlo
Hersteller:	Springer New York Springer US, New York, N.Y. Stochastic Modelling and Applied Probability
Maße:	241 x 160 x 40 mm
Von/Mit:	Luc Devroye (u. a.)
Erscheinungsdatum:	04.04.1996
Gewicht:	1,144 kg

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