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X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology
Taschenbuch von M. Steven Shackley
Sprache: Englisch

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Beschreibung
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come.
Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide.
The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come.
Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide.
The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
Über den Autor

M. Steven Shackley is Professor of Anthropology and Director of the Berkeley Archaeological XRF Laboratory at the University of California, Berkeley.

Zusammenfassung

No other volume examining recently technological advances of XRF for archaeological uses

Contributors are archaeologists, geologists, chemists and physicists

Guidance with this technology is invaluable for those working at historically or culturally sensitive sites where non-destructive analysis of archaeological materials is imperative

Includes supplementary material: [...]

Inhaltsverzeichnis

Introduction: Why XRF in Archaeology?- X-Ray Fluorescence Theory and Method.- Factors Affecting the Energy-Dispersive X-Ray Fluorescence (EDXRF) Analysis of Archaeological Obsidian.- Non-destructive EDXRF analyses of archaeological basalt.- Non-Destructive Applications of Wavelength XRF in Obsidian Studies.- Comparison and contrast between NAA and XRF: trace element analysis of the obsidian sources in central Mexico.- INAA versus XRF in Basalt Studies.- PXRF of archaeological artifacts: potentials and limitations.- Is There a Future for XRF in a 21st Century Archaeology?

Details
Erscheinungsjahr: 2012
Genre: Geschichte
Jahrhundert: Altertum
Rubrik: Geisteswissenschaften
Medium: Taschenbuch
Seiten: 252
Inhalt: XIV
231 S.
21 s/w Illustr.
11 farbige Illustr.
10 s/w Tab.
231 p. 32 illus.
11 illus. in color.
ISBN-13: 9781461436201
ISBN-10: 1461436206
Sprache: Englisch
Herstellernummer: 86058461
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Redaktion: Shackley, M. Steven
Herausgeber: M Steven Shackley
Auflage: 2011
Hersteller: Springer New York
Springer US, New York, N.Y.
Maße: 235 x 155 x 14 mm
Von/Mit: M. Steven Shackley
Erscheinungsdatum: 22.02.2012
Gewicht: 0,388 kg
preigu-id: 106625462
Über den Autor

M. Steven Shackley is Professor of Anthropology and Director of the Berkeley Archaeological XRF Laboratory at the University of California, Berkeley.

Zusammenfassung

No other volume examining recently technological advances of XRF for archaeological uses

Contributors are archaeologists, geologists, chemists and physicists

Guidance with this technology is invaluable for those working at historically or culturally sensitive sites where non-destructive analysis of archaeological materials is imperative

Includes supplementary material: [...]

Inhaltsverzeichnis

Introduction: Why XRF in Archaeology?- X-Ray Fluorescence Theory and Method.- Factors Affecting the Energy-Dispersive X-Ray Fluorescence (EDXRF) Analysis of Archaeological Obsidian.- Non-destructive EDXRF analyses of archaeological basalt.- Non-Destructive Applications of Wavelength XRF in Obsidian Studies.- Comparison and contrast between NAA and XRF: trace element analysis of the obsidian sources in central Mexico.- INAA versus XRF in Basalt Studies.- PXRF of archaeological artifacts: potentials and limitations.- Is There a Future for XRF in a 21st Century Archaeology?

Details
Erscheinungsjahr: 2012
Genre: Geschichte
Jahrhundert: Altertum
Rubrik: Geisteswissenschaften
Medium: Taschenbuch
Seiten: 252
Inhalt: XIV
231 S.
21 s/w Illustr.
11 farbige Illustr.
10 s/w Tab.
231 p. 32 illus.
11 illus. in color.
ISBN-13: 9781461436201
ISBN-10: 1461436206
Sprache: Englisch
Herstellernummer: 86058461
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Redaktion: Shackley, M. Steven
Herausgeber: M Steven Shackley
Auflage: 2011
Hersteller: Springer New York
Springer US, New York, N.Y.
Maße: 235 x 155 x 14 mm
Von/Mit: M. Steven Shackley
Erscheinungsdatum: 22.02.2012
Gewicht: 0,388 kg
preigu-id: 106625462
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