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X-Ray Diffraction
A Practical Approach
Taschenbuch von M. Grant Norton (u. a.)
Sprache: Englisch

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Beschreibung
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data.
Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it.
Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data.
Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it.
Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Inhaltsverzeichnis
I. Basics.- 1. X-Rays and Diffraction.- 2. Lattices and Crystal Structures.- 3. Practical Aspects of X-Ray Diffraction.- II. Experimental Modules.- Module 1. Crystal Structure Determination. I: Cubic Structures.- Module 2. Crystal Structure Determination. II: Hexagonal Structures.- Module 3. Precise Lattice Parameter Measurements.- Module 4. Phase Diagram Determination.- Module 5. Detection of Long-Range Ordering.- Module 6. Determination of Crystallite Size and Lattice Strain.- Module 7. Quantitative Analysis of Powder Mixtures.- Module 8. Identification of an Unknown Specimen.- Appendixes.- Appendix 1. Plane-Spacing Equations and Unit Cell Volumes.- Appendix 2. Quadratic Forms of Miller Indices for the Cubic System.- Appendix 3. Atomic and Ionic Scattering Factors of Some Selected Elements.- Appendix 4. Summary of Structure Factor Calculations.- Appendix 6. Multiplicity Factors.- Appendix 8. Physical Constants and Conversion Factors.- Appendix 9. JCPDS-ICDD Card Numbers for Some Common Materials.- Appendix 10. Crystal Structures and Lattice Parameters of Some Selected Materials.
Details
Erscheinungsjahr: 2013
Fachbereich: Fertigungstechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: xiii
273 S.
ISBN-13: 9781489901507
ISBN-10: 1489901507
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Norton, M. Grant
Suryanarayana, C.
Auflage: Softcover reprint of the original 1st edition 1998
Hersteller: Springer US
Springer New York
Springer US, New York, N.Y.
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 235 x 155 x 16 mm
Von/Mit: M. Grant Norton (u. a.)
Erscheinungsdatum: 06.06.2013
Gewicht: 0,441 kg
Artikel-ID: 105124318
Inhaltsverzeichnis
I. Basics.- 1. X-Rays and Diffraction.- 2. Lattices and Crystal Structures.- 3. Practical Aspects of X-Ray Diffraction.- II. Experimental Modules.- Module 1. Crystal Structure Determination. I: Cubic Structures.- Module 2. Crystal Structure Determination. II: Hexagonal Structures.- Module 3. Precise Lattice Parameter Measurements.- Module 4. Phase Diagram Determination.- Module 5. Detection of Long-Range Ordering.- Module 6. Determination of Crystallite Size and Lattice Strain.- Module 7. Quantitative Analysis of Powder Mixtures.- Module 8. Identification of an Unknown Specimen.- Appendixes.- Appendix 1. Plane-Spacing Equations and Unit Cell Volumes.- Appendix 2. Quadratic Forms of Miller Indices for the Cubic System.- Appendix 3. Atomic and Ionic Scattering Factors of Some Selected Elements.- Appendix 4. Summary of Structure Factor Calculations.- Appendix 6. Multiplicity Factors.- Appendix 8. Physical Constants and Conversion Factors.- Appendix 9. JCPDS-ICDD Card Numbers for Some Common Materials.- Appendix 10. Crystal Structures and Lattice Parameters of Some Selected Materials.
Details
Erscheinungsjahr: 2013
Fachbereich: Fertigungstechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Inhalt: xiii
273 S.
ISBN-13: 9781489901507
ISBN-10: 1489901507
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Norton, M. Grant
Suryanarayana, C.
Auflage: Softcover reprint of the original 1st edition 1998
Hersteller: Springer US
Springer New York
Springer US, New York, N.Y.
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 235 x 155 x 16 mm
Von/Mit: M. Grant Norton (u. a.)
Erscheinungsdatum: 06.06.2013
Gewicht: 0,441 kg
Artikel-ID: 105124318
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