Irene Wacker: Volume Microscopy | Buch

Cover: 9781071606902 | Volume Microscopy | Irene Wacker (u. a.) | Buch | xvii | Englisch

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Beschreibung

This volume discusses different approaches to workflows for large volume electron microscopy - from preparation of samples to their imaging in a variety of microscopes - in some cases also applying correlative techniques. The chapters in this book cover topics such as correlative super resolution and electron microscopy to detect molecules in their native cellular context; low-threshold access to serial section arrays; improving serial blockface SEM by focal charge compensation; FIBSEM analysis of interfaces between hard technical devices and soft neuronal tissue; and image processing for volume electron microscopy. In Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your laboratory.

Cutting-edge and authoritative, Volume Microscopy: Multiscale Imaging with Photons, Electrons, and Ions is a valuable resource for novice and expert scientists interested in learning more about this evolving field.

Zusammenfassung

Includes cutting-edge methods and protocols

Provides step-by-step detail essential for reproducible results

Contains key notes and implementation advice from the experts

Inhaltsverzeichnis

Correlative Super Resolution and Electron Microscopy to Detect Molecules in their Native Cellular Context.- Multi-Color Super-Resolution Microscopy: Revealing the Nano-World of Astrocytes In Situ.- High Resolution Molecular Imaging and Its Applications in Brain and Synapses.- Advancing Array Tomography to Study the Fine Ultrastructure of Identified Neurons in Zebrafish (Danio rerio).- A Low-Tech Approach to Serial Section Arrays.- Large Volumes in Ultrastructural Neuropathology Imaged by Array Tomography of Routine Diagnostic Samples.- Correlative Ultrastructural Analysis of Functionally Modulated Synapses using Automated Tape-Collecting Ultramicrotome and SEM Array Tomography.- Large-Scale Automated Serial Section Imaging using a Multi-Beam Scanning Electron Microscope.- Improving Serial Blockface SEM by Focal Charge Compensation.- Using X-Ray Microscopy to Increase Targeting Accuracy in Serial Block-Face Scanning Electron Microscopy.- FIBSEM Analysis of Interfaces between Hard Technical Devices and Soft Neuronal Tissue.- Transforming FIB-SEM Systems for Large Volume Connectomics and Cell Biology.- Image Processing for Volume Electron Microscopy.- Forget about Electron Micrographs: A Novel Guide for using 3D Models for Quantitative Analysis of Dense Reconstructions.

Details

Erscheinungsjahr:	2020
Fachbereich:	Therapie
Genre:	Importe , Medizin
Rubrik:	Wissenschaften
Medium:	Buch
Inhalt:	xvii 306 S. 19 s/w Illustr. 88 farbige Illustr. 306 p. 107 illus. 88 illus. in color. With online files/update.
ISBN-13:	9781071606902
ISBN-10:	1071606905
Sprache:	Englisch
Einband:	Gebunden
Redaktion:	Wacker, Irene Schröder, Rasmus Burgold, Steffen Hummel, Eric
Herausgeber:	Irene Wacker/Eric Hummel/Steffen Burgold et al
Auflage:	1st edition 2020
Hersteller:	Springer US Springer US, New York, N.Y.
Verantwortliche Person für die EU:	Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße:	260 x 183 x 24 mm
Von/Mit:	Irene Wacker (u. a.)
Erscheinungsdatum:	30.06.2020
Gewicht:	0,809 kg