Zur Startseite gehen
0,00 €*
Cover: 9783319819860 | Physical Principles of Electron Microscopy | R. F. Egerton | Buch
Dekorationsartikel gehören nicht zum Leistungsumfang.
Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
Taschenbuch von R. F. Egerton
Sprache: Englisch

57,70 €*

inkl. MwSt.

Versandkostenfrei per Post / DHL

Lieferzeit 4-7 Werktage

Kategorien:
Beschreibung
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Über den Autor
Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.
Zusammenfassung

Inhaltsverzeichnis
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations.
Details
Erscheinungsjahr: 2018
Fachbereich: Fertigungstechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Seiten: 208
Inhalt: xi
196 S.
109 s/w Illustr.
15 farbige Illustr.
196 p. 124 illus.
15 illus. in color.
ISBN-13: 9783319819860
ISBN-10: 3319819860
Sprache: Englisch
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Autor: Egerton, R. F.
Auflage: Softcover reprint of the original 2nd ed. 2016
Hersteller: Springer International Publishing
Springer International Publishing AG
Maße: 235 x 155 x 12 mm
Von/Mit: R. F. Egerton
Erscheinungsdatum: 30.05.2018
Gewicht: 0,324 kg
preigu-id: 114147143
Über den Autor
Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.
Zusammenfassung

Inhaltsverzeichnis
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations.
Details
Erscheinungsjahr: 2018
Fachbereich: Fertigungstechnik
Genre: Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Seiten: 208
Inhalt: xi
196 S.
109 s/w Illustr.
15 farbige Illustr.
196 p. 124 illus.
15 illus. in color.
ISBN-13: 9783319819860
ISBN-10: 3319819860
Sprache: Englisch
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Autor: Egerton, R. F.
Auflage: Softcover reprint of the original 2nd ed. 2016
Hersteller: Springer International Publishing
Springer International Publishing AG
Maße: 235 x 155 x 12 mm
Von/Mit: R. F. Egerton
Erscheinungsdatum: 30.05.2018
Gewicht: 0,324 kg
preigu-id: 114147143
Warnhinweis

Ähnliche Produkte

Ähnliche Produkte

Taschenbuch
Cover: 9783540211624 | Physik für Biologen | Dietrich Pelte | Taschenbuch | Springer-Lehrbuch
Physik für Biologen
Die physikalischen Grundlagen der Biophysik und anderer Naturwissenschaften
EAN: 9783540211624
Sprache: Deutsch
Von/Mit: Dietrich Pelte

54,99 €*

Lieferzeit 1-2 Werktage

Buch
Cover: 9784431554165 | Radioactive Waste Engineering and Management | Nakayama (u. a.) | Buch
Radioactive Waste Engineering and Management
EAN: 9784431554165
Sprache: Englisch
Von/Mit: Shinichi Nakayama (u. a.)

164,95 €*

Lieferzeit 1-2 Werktage

Taschenbuch
Cover: 9783642736902 | From Chemical to Biological Organization | Mario Markus (u. a.) | Buch
From Chemical to Biological Organization
EAN: 9783642736902
Sprache: Englisch
Von/Mit: Mario Markus (u. a.)

55,20 €*

Lieferzeit 1-2 Wochen

Taschenbuch
Cover: 9781441935397 | Case Studies in Superconducting Magnets | Yukikazu Iwasa | Taschenbuch
Case Studies in Superconducting Magnets
Design and Operational Issues
EAN: 9781441935397
Von/Mit: Yukikazu Iwasa

77,95 €*

Lieferzeit 1-2 Wochen

Taschenbuch
Cover: 9783110727296 | Bioinorganic Chemistry | Some New Facets | Ram Charitra Maurya | Buch
Bioinorganic Chemistry
Some New Facets
EAN: 9783110727296
Sprache: Englisch
Von/Mit: Ram Charitra Maurya

71,85 €*

Lieferzeit 1-2 Wochen

Taschenbuch
Cover: 9781300545576 | Flying the Cirrus SR22 Turbo | Pete Cook | Taschenbuch | Paperback
Flying the Cirrus SR22 Turbo
Step-by-Step VFR, with Perspective Avionics
EAN: 9781300545576
Sprache: Englisch
Von/Mit: Pete Cook

91,60 €*

Lieferzeit 1-2 Wochen

Taschenbuch
Cover: 9783030902735 | Biological and Bio-Inspired Fluid Dynamics | Theory and Application
Biological and Bio-Inspired Fluid Dynamics
Theory and Application
EAN: 9783030902735
Sprache: Englisch
Von/Mit: David E. Rival

62,10 €*

Lieferzeit 4-7 Werktage

Buch
Cover: 9781569909188 | Disruptive 3D Printing | Ralf Anderhofstadt (u. a.) | Buch | Englisch
Disruptive 3D Printing
EAN: 9781569909188
Sprache: Englisch
Von/Mit: Ralf Anderhofstadt (u. a.)

100,50 €*

Aktuell nicht verfügbar

Taschenbuch
Cover: 9783031205125 | Handbook of II-VI Semiconductor-Based Sensors and Radiation Detectors
Handbook of II-VI Semiconductor-Based Sensors and Radiation Detectors
Volume 2, Photodetectors
EAN: 9783031205125
Sprache: Englisch
Von/Mit: Ghenadii Korotcenkov

75,20 €*

Lieferzeit 4-7 Werktage

Diese Website verwendet Cookies, um eine bestmögliche Erfahrung bieten zu können. Mehr Informationen ...