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Beschreibung
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it.
MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it.
MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Zusammenfassung

Demonstrates how to design MEMs for reliability during the product life cycle focusing CAD methodologies and system level architecture

Provides detailed information on the different types of failure modes, including but not limited to, design failures, manufacturing failures, and material failure, and how to avoid them

Discusses testing, qualification, processes and procedures for MEMs reliability and the specific tests for enhancing reliability

Includes supplementary material: [...]

Inhaltsverzeichnis

Introduction.- Reliability /Weibull, bathtub curve, basics (What is reliability?).- Failure Modes and Physics of Failure (POF).- Strategies for identifying root cause (FMEA).- Manufacturing Processes & Procedures.- Testing & Qualification Processes & Procedures.- Improving Reliability: Techniques and Tools.- Design for Reliability (DFR).

Details
Erscheinungsjahr: 2012
Fachbereich: Nachrichtentechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Reihe: MEMS Reference Shelf
Inhalt: xiii
291 S.
ISBN-13: 9781461427360
ISBN-10: 1461427363
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Hartzell, Allyson L.
Da Silva, Mark G.
Shea, Herbert R.
Hersteller: Springer
Springer US, New York, N.Y.
MEMS Reference Shelf
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 235 x 155 x 17 mm
Von/Mit: Allyson L. Hartzell (u. a.)
Erscheinungsdatum: 27.12.2012
Gewicht: 0,47 kg
Artikel-ID: 106094545

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