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Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis.
Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis.
Olaf Engler is senior scientist of metallurgy at the Research and Development Center of Hydro Aluminium in Bonn, Germany. Prior to that, he was at the University of Technology in Aachen, Germany, and the Materials Science and Technology Division of Los Alamos National Laboratory in the United States. Since 2004, he has also been an adjunct professor for Texture and Crystal Plasticity at the NTNU Trondheim, Norway, and a member of the international committee of the International Conference on Texture of Materials (ICOTOM). Engler has more than 20 years of experience in analysis, interpretation, and modeling of the development of microstructure and texture during the thermomechanical processing of metallic materials and control of the resulting materials properties.
Stefan Zaefferer is Group Leader, Microscopy and Diffraction, Max-Planck-Institut für Eisenforschung GmbH.
Part I: Fundamental Issues. 1. Introduction. 2. Descriptors of Orientation. 3. Application of Diffraction to Texture Analysis. Part II: Macrotexture Analysis. 4. Macrotexture Measurements. 5. Evaluation and Representation of Macrotexture Data. Part III: Microtexture Analysis. 6. Diffraction Techniques in TEM and SEM. 7. Procedures for Orientation Determination from Electron Diffraction Patterns. 8. Practice of Orientation Measurement and Orientation Microscopy. 9. Orientation Microscopy and Orientation Mapping. 10. Evaluation and Representation of Microtexture Data. 11. Crystallographic Analysis of Interfaces, Surfaces, and Connectivity. 12. Orientation Relationships between Phases and Texture Formation during Phase Transformations. 13. Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods. Appendices.
| Erscheinungsjahr: | 2024 |
|---|---|
| Fachbereich: | Atomphysik & Kernphysik |
| Genre: | Importe, Physik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| ISBN-13: | 9781032189420 |
| ISBN-10: | 1032189428 |
| Sprache: | Englisch |
| Einband: | Kartoniert / Broschiert |
| Autor: |
Engler, Olaf
Zaefferer, Stefan Randle, Valerie |
| Auflage: | 3. Auflage |
| Hersteller: | CRC Press |
| Verantwortliche Person für die EU: | Libri GmbH, Europaallee 1, D-36244 Bad Hersfeld, gpsr@libri.de |
| Maße: | 234 x 156 x 31 mm |
| Von/Mit: | Olaf Engler (u. a.) |
| Erscheinungsdatum: | 27.02.2024 |
| Gewicht: | 0,872 kg |
Olaf Engler is senior scientist of metallurgy at the Research and Development Center of Hydro Aluminium in Bonn, Germany. Prior to that, he was at the University of Technology in Aachen, Germany, and the Materials Science and Technology Division of Los Alamos National Laboratory in the United States. Since 2004, he has also been an adjunct professor for Texture and Crystal Plasticity at the NTNU Trondheim, Norway, and a member of the international committee of the International Conference on Texture of Materials (ICOTOM). Engler has more than 20 years of experience in analysis, interpretation, and modeling of the development of microstructure and texture during the thermomechanical processing of metallic materials and control of the resulting materials properties.
Stefan Zaefferer is Group Leader, Microscopy and Diffraction, Max-Planck-Institut für Eisenforschung GmbH.
Part I: Fundamental Issues. 1. Introduction. 2. Descriptors of Orientation. 3. Application of Diffraction to Texture Analysis. Part II: Macrotexture Analysis. 4. Macrotexture Measurements. 5. Evaluation and Representation of Macrotexture Data. Part III: Microtexture Analysis. 6. Diffraction Techniques in TEM and SEM. 7. Procedures for Orientation Determination from Electron Diffraction Patterns. 8. Practice of Orientation Measurement and Orientation Microscopy. 9. Orientation Microscopy and Orientation Mapping. 10. Evaluation and Representation of Microtexture Data. 11. Crystallographic Analysis of Interfaces, Surfaces, and Connectivity. 12. Orientation Relationships between Phases and Texture Formation during Phase Transformations. 13. Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods. Appendices.
| Erscheinungsjahr: | 2024 |
|---|---|
| Fachbereich: | Atomphysik & Kernphysik |
| Genre: | Importe, Physik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| ISBN-13: | 9781032189420 |
| ISBN-10: | 1032189428 |
| Sprache: | Englisch |
| Einband: | Kartoniert / Broschiert |
| Autor: |
Engler, Olaf
Zaefferer, Stefan Randle, Valerie |
| Auflage: | 3. Auflage |
| Hersteller: | CRC Press |
| Verantwortliche Person für die EU: | Libri GmbH, Europaallee 1, D-36244 Bad Hersfeld, gpsr@libri.de |
| Maße: | 234 x 156 x 31 mm |
| Von/Mit: | Olaf Engler (u. a.) |
| Erscheinungsdatum: | 27.02.2024 |
| Gewicht: | 0,872 kg |
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