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Hybrid Bonding, Advanced Substrates, Failure Mechanisms, and Thermal Management for Chiplets and Heterogeneous...
Buch von Xuejun Fan (u. a.)
Sprache: Englisch

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Beschreibung

The book focuses on the design, materials, process, fabrication, failure mechanism, reliability, modeling, and thermal management of chiplets and heterogeneous integration. Both principles and engineering practice have been addressed, with more weight placed on engineering practice. This is achieved by providing in-depth study on a number of major topics such as hybrid bonding, advanced substrates, failure mechanisms, and modeling due to thermal stresses, moisture absorption, impact loading such as drop as well as electric current driven electromigration, and the fundamentals of thermal management. Each topic is treated with in-depth analysis to bridge foundational principles with real-world engineering challenges. This book is an essential resource for researchers, engineers, and students in electrical engineering, mechanical engineering, materials science, and industrial engineering, equipping them with the knowledge to advance innovation in semiconductor packaging and integration.

The book focuses on the design, materials, process, fabrication, failure mechanism, reliability, modeling, and thermal management of chiplets and heterogeneous integration. Both principles and engineering practice have been addressed, with more weight placed on engineering practice. This is achieved by providing in-depth study on a number of major topics such as hybrid bonding, advanced substrates, failure mechanisms, and modeling due to thermal stresses, moisture absorption, impact loading such as drop as well as electric current driven electromigration, and the fundamentals of thermal management. Each topic is treated with in-depth analysis to bridge foundational principles with real-world engineering challenges. This book is an essential resource for researchers, engineers, and students in electrical engineering, mechanical engineering, materials science, and industrial engineering, equipping them with the knowledge to advance innovation in semiconductor packaging and integration.

Über den Autor

John H. Lau was the CTO from July 2019 to July 2021 and has been a Senior Special Project Assistant since August 2021 of Unimicron in Taiwan. Prior to that, he was a Senior Technical Advisor at ASM Pacific Technology in Hong Kong for 5 years; a specialist of the Industrial Technology Research Institute in Taiwan for 5 years; a Visiting Professor at Hong Kong University of Science and Technology for 1 year; the Director of the Microsystems, Modules, and Components Laboratory at the Institute of Microelectronics in Singapore for 2 years; and a Senior Scientist/MTS at Hewlett-Packard Laboratory/Agilent in California for more than 25 years. He earned a Ph.D. degree in theoretical and applied mechanics from the University of Illinois at Urbana–Champaign, an M.[...]. degree in structural engineering from the University of British Columbia, a second M.S. degree in engineering mechanics from the University of Wisconsin at Madison, and a third M.S. degree in management science from Fairleigh Dickinson University in New Jersey. He also has a B.E. degree in civil engineering from National Taiwan University.

Dr. Xuejun Fan, Regents’ Professor of the Texas State University System and Mary Ann and Lawrence E. Faust Endowed Professor at Lamar University, is internationally recognized for his expertise in electronic packaging reliability and modeling. With over 25 years of experience spanning academia and industry, he has held key roles at the Institute of Microelectronics in Singapore, Philips Research in New York, and Intel Corporation in Arizona. Dr. Fan has authored 4 books, 25 book chapters, and over 340 technical papers, holds multiple patents, and provides consultancy for global patent litigation. A sought-after speaker, he has delivered numerous tutorials, workshops, and keynote lectures worldwide. He is an IEEE Fellow, a long-standing IEEE Distinguished Lecturer, and Associate Editor for multiple leading journals, including IEEE Transactions on Components, Packaging and Manufacturing Technology. He has received prestigious honors such as the IEEE EPS Outstanding Sustained Technical Contribution Award (2017), EuroSimE Achievement Award (2023), and consistent recognition among the top 2% of scientists globally by Stanford University. Earlier in his career, he became one of China’s youngest full professors at age 27 while at Taiyuan University of Technology, where he held leadership roles and advanced research in applied mechanics. Dr. Fan earned his Ph.D. in Solid Mechanics from Tsinghua University and his B.S. and M.S. from Tianjin University, solidifying his foundation in applied mechanics and reliability engineering.

Inhaltsverzeichnis

Chiplet Design and Heterogeneous Integration Packaging.- Advanced Substrates for Chiplet and Heterogeneous Integration.- Cu-Cu Bumpless Hybrid Bonding.- Warpage Management in Semiconductor Packaging.- Simulation and Optimization of Thermal-Mechanical and Mechanical Reliability of Solder Joint.- Moisture Reliability, Failure Mechanisms and Moisture Diffusion Modeling.- Design Rules for Electromigration Failure.- Thermal Management.

Details
Erscheinungsjahr: 2025
Fachbereich: Nachrichtentechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Titel: Hybrid Bonding, Advanced Substrates, Failure Mechanisms, and Thermal Management for Chiplets and Heterogeneous Integration
Inhalt: xxiv
645 S.
66 s/w Illustr.
557 farbige Illustr.
645 p. 623 illus.
557 illus. in color.
ISBN-13: 9789819641659
ISBN-10: 9819641659
Sprache: Englisch
Einband: Gebunden
Autor: Fan, Xuejun
Lau, John
Hersteller: Springer Singapore
Springer Nature Singapore
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 241 x 160 x 39 mm
Von/Mit: Xuejun Fan (u. a.)
Erscheinungsdatum: 19.05.2025
Gewicht: 1,282 kg
Artikel-ID: 133335875
Über den Autor

John H. Lau was the CTO from July 2019 to July 2021 and has been a Senior Special Project Assistant since August 2021 of Unimicron in Taiwan. Prior to that, he was a Senior Technical Advisor at ASM Pacific Technology in Hong Kong for 5 years; a specialist of the Industrial Technology Research Institute in Taiwan for 5 years; a Visiting Professor at Hong Kong University of Science and Technology for 1 year; the Director of the Microsystems, Modules, and Components Laboratory at the Institute of Microelectronics in Singapore for 2 years; and a Senior Scientist/MTS at Hewlett-Packard Laboratory/Agilent in California for more than 25 years. He earned a Ph.D. degree in theoretical and applied mechanics from the University of Illinois at Urbana–Champaign, an M.[...]. degree in structural engineering from the University of British Columbia, a second M.S. degree in engineering mechanics from the University of Wisconsin at Madison, and a third M.S. degree in management science from Fairleigh Dickinson University in New Jersey. He also has a B.E. degree in civil engineering from National Taiwan University.

Dr. Xuejun Fan, Regents’ Professor of the Texas State University System and Mary Ann and Lawrence E. Faust Endowed Professor at Lamar University, is internationally recognized for his expertise in electronic packaging reliability and modeling. With over 25 years of experience spanning academia and industry, he has held key roles at the Institute of Microelectronics in Singapore, Philips Research in New York, and Intel Corporation in Arizona. Dr. Fan has authored 4 books, 25 book chapters, and over 340 technical papers, holds multiple patents, and provides consultancy for global patent litigation. A sought-after speaker, he has delivered numerous tutorials, workshops, and keynote lectures worldwide. He is an IEEE Fellow, a long-standing IEEE Distinguished Lecturer, and Associate Editor for multiple leading journals, including IEEE Transactions on Components, Packaging and Manufacturing Technology. He has received prestigious honors such as the IEEE EPS Outstanding Sustained Technical Contribution Award (2017), EuroSimE Achievement Award (2023), and consistent recognition among the top 2% of scientists globally by Stanford University. Earlier in his career, he became one of China’s youngest full professors at age 27 while at Taiyuan University of Technology, where he held leadership roles and advanced research in applied mechanics. Dr. Fan earned his Ph.D. in Solid Mechanics from Tsinghua University and his B.S. and M.S. from Tianjin University, solidifying his foundation in applied mechanics and reliability engineering.

Inhaltsverzeichnis

Chiplet Design and Heterogeneous Integration Packaging.- Advanced Substrates for Chiplet and Heterogeneous Integration.- Cu-Cu Bumpless Hybrid Bonding.- Warpage Management in Semiconductor Packaging.- Simulation and Optimization of Thermal-Mechanical and Mechanical Reliability of Solder Joint.- Moisture Reliability, Failure Mechanisms and Moisture Diffusion Modeling.- Design Rules for Electromigration Failure.- Thermal Management.

Details
Erscheinungsjahr: 2025
Fachbereich: Nachrichtentechnik
Genre: Importe, Technik
Rubrik: Naturwissenschaften & Technik
Medium: Buch
Titel: Hybrid Bonding, Advanced Substrates, Failure Mechanisms, and Thermal Management for Chiplets and Heterogeneous Integration
Inhalt: xxiv
645 S.
66 s/w Illustr.
557 farbige Illustr.
645 p. 623 illus.
557 illus. in color.
ISBN-13: 9789819641659
ISBN-10: 9819641659
Sprache: Englisch
Einband: Gebunden
Autor: Fan, Xuejun
Lau, John
Hersteller: Springer Singapore
Springer Nature Singapore
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 241 x 160 x 39 mm
Von/Mit: Xuejun Fan (u. a.)
Erscheinungsdatum: 19.05.2025
Gewicht: 1,282 kg
Artikel-ID: 133335875
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