High Speed CMOS Design Styles | Buch

Cover: 9780792382201 | High Speed CMOS Design Styles | Kerry Bernstein (u. a.) | Buch | xix

Rückseite: 9780792382201 | High Speed CMOS Design Styles | Kerry Bernstein (u. a.) | Buch | xix

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Sprache: Englisch

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Beschreibung

High Speed CMOS Design Styles is written for the graduate-level student or practicing engineer who is primarily interested in circuit design. It is intended to provide practical reference, or `horse-sense', to mechanisms typically described with a more academic slant. This book is organized so that it can be used as a textbook or as a reference book.
High Speed CMOS Design Styles provides a survey of design styles in use in industry, specifically in the high speed microprocessor design community. Logic circuit structures, I/O and interface, clocking, and timing schemes are reviewed and described. Characteristics, sensitivities and idiosyncrasies of each are highlighted. High Speed CMOS Design Styles also pulls together and explains contributors to performance variability that are associated with process, applications conditions and design. Rules of thumb and practical references are offered. Each of the general circuit families is then analyzed for its sensitivity and response to this variability.
High Speed CMOS Design Styles is an excellent source of ideas and a compilation of observations that highlight how different approaches trade off critical parameters in design and process space.

Inhaltsverzeichnis

1 Process Variability.- 1.1 Introduction.- 1.2 Front-End-Of-Line Variability Considerations.- 1.3 Charge Loss Mechanisms.- 1.4 Back-End-Of-Line Variability Considerations.- 1.5 Summary.- 2 Non-Clocked Logic Styles.- 2.1 Introduction.- 2.2 Static CMOS Structures.- 2.3 DCVS Logic.- 2.4 Non-Clocked Pass-Gate Families.- 2.5 Summary.- 3 Clocked Logic Styles.- 3.1 Introduction.- 3.2 Single-Rail Domino Logic Styles.- 3.3 Alternating-Polarity Domino Approaches.- 3.4 Dual-Rail Domino Structures.- 3.5 Latched Domino Structures.- 3.6 Clocked Pass-Gate Logic.- 3.7 Summary.- 4 Circuit Design Margin and Design Variability.- 4.1 Introduction.- 4.2 Process Induced Variation.- 4.3 Design Induced Variation.- 4.4 Application Induced Variation.- 4.5 Noise.- 4.6 Design Margin Budgeting.- 4.7 Summary.- 5 Latching Strategies.- 5.1 Introduction.- 5.2 Basic Latch Design.- 5.3 Latching Single-Ended Logic.- 5.4 Latching Differential Logic.- 5.5 Race Free Latches for Precharged Logic.- 5.6 Asynchronous Latch Techniques.- 5.7 Summary.- 6 Interface Techniques.- 6.1 Introduction.- 6.2 Signaling Standards.- 6.3 Chip-to-chip Communication Networks.- 6.4 ESD Protection.- 6.5 Driver Design Techniques.- 6.6 Receiver Design Techniques.- 6.7 Summary.- 7 Clocking Styles.- 7.1 Introduction.- 7.2 Clock Jitter and Skew.- 7.3 Clock Generation.- 7.4 Clock Distribution.- 7.5 Single Phase Clocking.- 7.6 Multi-Phase Clocking.- 7.7 Asynchronous Techniques.- 7.8 Summary.- 8 Slack Borrowing and Time Stealing.- 8.1 Introduction.- 8.2 Slack Borrowing.- 8.3 Time Stealing.- 8.4 Summary.- 9 Future Technology.- 9.1 Introduction.- 9.2 Classical Scaling Theory.- 9.3 Industry Trends Define Scaling Law.- 9.4 Challenges Presented by I/S Scaling.- 9.5 Possible Directions.

Erscheinungsjahr:	1998
Fachbereich:	Nachrichtentechnik
Genre:	Importe , Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Buch
Inhalt:	xix 353 S.
ISBN-13:	9780792382201
ISBN-10:	079238220X
Sprache:	Englisch
Einband:	Gebunden
Autor:	Bernstein, Kerry Carrig, K. M. Durham, Christopher M. Rohrer, Norman J. Hogenmiller, David Nowak, Edward J. Hansen, Patrick R.
Hersteller:	Springer US Springer US, New York, N.Y.
Verantwortliche Person für die EU:	Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße:	241 x 160 x 25 mm
Von/Mit:	Kerry Bernstein (u. a.)
Erscheinungsdatum:	31.08.1998
Gewicht:	0,735 kg

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