High Resolution X-Ray Diffractometry And T...

$Cover: 9780367400637 | High Resolution X-Ray Diffractometry And Topography | Bowen (u. a.)$

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Sprache: Englisch

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Beschreibung

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.

Über den Autor

Bowen, D.K.; Tanner, Brian K.

Inhaltsverzeichnis

Introduction- diffraction studies of crystal perfection; high resolution X- ray diffraction techniques; analysis of expitaxial layers; X-ray scattering theory; simulation of X-ray diffraction rocking curves; analysis of thin films and multiple layers; triple axis X-ray diffractometry; single crystal X-ray topography; double crystal X-ray topography; synchrotron radiation topography.

Details

Erscheinungsjahr:	2019
Fachbereich:	Allgemeines
Genre:	Importe , Technik
Rubrik:	Naturwissenschaften & Technik
Medium:	Taschenbuch
Inhalt:	Einband - flex.(Paperback)
ISBN-13:	9780367400637
ISBN-10:	0367400634
Sprache:	Englisch
Einband:	Kartoniert / Broschiert
Autor:	Bowen, D. K. Tanner, Brian K.
Hersteller:	CRC Press
Verantwortliche Person für die EU:	Libri GmbH, Europaallee 1, D-36244 Bad Hersfeld, gpsr@libri.de
Maße:	246 x 174 x 14 mm
Von/Mit:	D. K. Bowen (u. a.)
Erscheinungsdatum:	10.10.2019
Gewicht:	0,476 kg