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FUNDAM ATOM FORCE MICROSC (P1)
Taschenbuch von Ronald Reifenberger
Sprache: Englisch

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Beschreibung
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
Inhaltsverzeichnis
Contents: Introduction to Scanning Probe Microscopy; The Force between Molecules; Simple Models for Molecule-Molecule Interactions; van der Waals Interactions between Macroscopic Objects; When the Tip Contacts the Substrate: Contact Mechanics; Quasi-Static Cantilever Mechanics; AFM System Components; Contact Mode AFM; Experimental Calibrations; Computer-Aided AFM Simulations;
Details
Erscheinungsjahr: 2015
Fachbereich: Atomphysik & Kernphysik
Genre: Physik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
ISBN-13: 9789814630351
ISBN-10: 9814630357
Sprache: Englisch
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Autor: Ronald Reifenberger
Hersteller: World Scientific
Maße: 229 x 152 x 18 mm
Von/Mit: Ronald Reifenberger
Erscheinungsdatum: 29.09.2015
Gewicht: 0,496 kg
Artikel-ID: 104994756
Inhaltsverzeichnis
Contents: Introduction to Scanning Probe Microscopy; The Force between Molecules; Simple Models for Molecule-Molecule Interactions; van der Waals Interactions between Macroscopic Objects; When the Tip Contacts the Substrate: Contact Mechanics; Quasi-Static Cantilever Mechanics; AFM System Components; Contact Mode AFM; Experimental Calibrations; Computer-Aided AFM Simulations;
Details
Erscheinungsjahr: 2015
Fachbereich: Atomphysik & Kernphysik
Genre: Physik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
ISBN-13: 9789814630351
ISBN-10: 9814630357
Sprache: Englisch
Ausstattung / Beilage: Paperback
Einband: Kartoniert / Broschiert
Autor: Ronald Reifenberger
Hersteller: World Scientific
Maße: 229 x 152 x 18 mm
Von/Mit: Ronald Reifenberger
Erscheinungsdatum: 29.09.2015
Gewicht: 0,496 kg
Artikel-ID: 104994756
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