Energy Dispersive X-ray Analysis in the El...

Dekorationsartikel gehören nicht zum Leistungsumfang.

Sprache: Englisch

156,95 €

inkl. MwSt.

Versandkostenfrei per Post / DHL

Lieferzeit 1-2 Wochen

Kategorien:

Beschreibung

This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.

Über den Autor

DC Bell, AJ Garratt-Reed

Inhaltsverzeichnis

Ch 1. HISTORY. Ch 2. PRINCIPLES. What are X-rays?. Ionization cross-section. Fluorescence yield. X-ray absorption. Insulators, conductors and semiconductors. Ch 3. THE ENERGY-DISPERSIVE X-RAY DETECTOR. [...] semiconductor X-ray detector. The X-ray analyser. Details of the spectrum. New detector technologies. Ch 4. SPECTRAL PROCESSING. Introduction. Background stripping. Background modelling. Deconvolution of overlapping peaks. Statistical considerations. The impact of statistics. The effect of the background. Analytical strategy. Ch 5. ENERGY-DISPERSIVE X-RAY MICROANALYSIS IN THE SCANNING ELECTRON MICROSCOPE. Introduction. Fundamentals of X-ray analysis in the SEM. Quantitative microanalysis in the SEM. Semi-quantitative microanalysis in the SEM. EDX analysis in the VP-SEM and ESEM. Inhomogeneous samples. Concluding remarks. Ch 6. X-RAY MICROANALYSIS IN THE TRANSMISSION ELECTRON MICROSCOPE. Introduction. Principles of quantitative analysis in the TEM. Absorption, fluorescence and other sources of error. Spatial resolution. Microscope considerations. Ch 7. X-RAY MAPPING. Introduction. Hardware implementation. Statistical considerations. Other applications. Concluding comments. Ch 8. ENERGY-DISPERSIVE X-RAY ANALYSIS COMPARED WITH OTHER TECHNIQUES. Introduction. Wavelength-dispersive X-ray analysis - electron probe microanalysis (EPMA). Electron energy-loss spectroscopy (EELS). Auger electron spectroscopy (AES). X-ray photoelectron spectroscopy (XPS). X-ray fluorescence (XRF). Atom probe. Overall strengths and weaknesses.

Details

Erscheinungsjahr:	2003
Fachbereich:	Therapie
Genre:	Importe , Medizin
Rubrik:	Wissenschaften
Medium:	Taschenbuch
Inhalt:	Einband - flex.(Paperback)
ISBN-13:	9781859961094
ISBN-10:	1859961096
Sprache:	Englisch
Einband:	Kartoniert / Broschiert
Autor:	Bell, Dc Garratt-Reed, Aj
Hersteller:	Garland Science
Verantwortliche Person für die EU:	Libri GmbH, Europaallee 1, D-36244 Bad Hersfeld, gpsr@libri.de
Maße:	229 x 152 x 9 mm
Von/Mit:	Dc Bell (u. a.)
Erscheinungsdatum:	10.07.2003
Gewicht:	0,242 kg