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Manjul Bhushan is a technical consultant in New York.
Mark Ketchen is a technical consultant in Massachusetts.
Relates CMOS product performance to basic physical models of transistors and passive elements
Uses embedded test structures and sensors for product test debug, yield and performance evaluation
Describes impact of device variability
Discusses application corners, schmooing and product specifications including guardbands
Presents an overall view of CMOS product chip test, test equipment and diagnostic tools
Describes data analysis techniques for rapid evaluation and debug during test
Features nearly 300 illustrations
Includes supplementary material: [...]
Request lecturer material: [...]
Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
| Erscheinungsjahr: | 2016 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| Inhalt: |
xiii
424 S. 338 s/w Illustr. 424 p. 338 illus. |
| ISBN-13: | 9781493947027 |
| ISBN-10: | 1493947028 |
| Sprache: | Englisch |
| Ausstattung / Beilage: | Paperback |
| Einband: | Kartoniert / Broschiert |
| Autor: |
Ketchen, Mark B.
Bhushan, Manjul |
| Auflage: | Softcover reprint of the original 1st ed. 2015 |
| Hersteller: |
Springer New York
Springer US, New York, N.Y. |
| Maße: | 235 x 155 x 24 mm |
| Von/Mit: | Mark B. Ketchen (u. a.) |
| Erscheinungsdatum: | 10.09.2016 |
| Gewicht: | 0,663 kg |
Manjul Bhushan is a technical consultant in New York.
Mark Ketchen is a technical consultant in Massachusetts.
Relates CMOS product performance to basic physical models of transistors and passive elements
Uses embedded test structures and sensors for product test debug, yield and performance evaluation
Describes impact of device variability
Discusses application corners, schmooing and product specifications including guardbands
Presents an overall view of CMOS product chip test, test equipment and diagnostic tools
Describes data analysis techniques for rapid evaluation and debug during test
Features nearly 300 illustrations
Includes supplementary material: [...]
Request lecturer material: [...]
Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
| Erscheinungsjahr: | 2016 |
|---|---|
| Fachbereich: | Nachrichtentechnik |
| Genre: | Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Taschenbuch |
| Inhalt: |
xiii
424 S. 338 s/w Illustr. 424 p. 338 illus. |
| ISBN-13: | 9781493947027 |
| ISBN-10: | 1493947028 |
| Sprache: | Englisch |
| Ausstattung / Beilage: | Paperback |
| Einband: | Kartoniert / Broschiert |
| Autor: |
Ketchen, Mark B.
Bhushan, Manjul |
| Auflage: | Softcover reprint of the original 1st ed. 2015 |
| Hersteller: |
Springer New York
Springer US, New York, N.Y. |
| Maße: | 235 x 155 x 24 mm |
| Von/Mit: | Mark B. Ketchen (u. a.) |
| Erscheinungsdatum: | 10.09.2016 |
| Gewicht: | 0,663 kg |
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