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Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
Presents a detailed description of the analysis tools
Includes practical examples of how the technique can be used in materials science research
Stands as a must-have reference for any user of atom probe microscopy
Includes supplementary material: [...]
Preface.- Acknowledgements.- List of Acronyms and Abbreviations.- List of Terms.- List of Non-SI Units and Constant Values.- PART I Fundamentals.- 1. Introduction.- 2. Field Ion Microscopy.- 3 From Field Desorption Microscopy to Atom Probe Tomography.- Part II Practical aspects.- 4. Specimen Preparation.- 5. Experimental protocols in Field Ion Microscopy.- 6. Experimental protocols.- 7. Tomographic reconstruction.- PART III Applying atom probe techniques for materials science.- 8. Analysis techniques for atom probe tomography.- 9. Atom probe microscopy and materials science.- Appendices.
| Erscheinungsjahr: | 2012 |
|---|---|
| Fachbereich: | Fertigungstechnik |
| Genre: | Importe, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Buch |
| Inhalt: |
xxiv
396 S. |
| ISBN-13: | 9781461434351 |
| ISBN-10: | 1461434351 |
| Sprache: | Englisch |
| Herstellernummer: | 80096274 |
| Einband: | Gebunden |
| Autor: |
Gault, Baptiste
Ringer, Simon P. Cairney, Julie M. Moody, Michael P. |
| Hersteller: |
Springer New York
Springer US, New York, N.Y. |
| Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
| Maße: | 241 x 160 x 27 mm |
| Von/Mit: | Baptiste Gault (u. a.) |
| Erscheinungsdatum: | 14.05.2012 |
| Gewicht: | 0,793 kg |
Provides the most practical, up-to-date and critical review of atom probe microscopy techniques
Presents a detailed description of the analysis tools
Includes practical examples of how the technique can be used in materials science research
Stands as a must-have reference for any user of atom probe microscopy
Includes supplementary material: [...]
Preface.- Acknowledgements.- List of Acronyms and Abbreviations.- List of Terms.- List of Non-SI Units and Constant Values.- PART I Fundamentals.- 1. Introduction.- 2. Field Ion Microscopy.- 3 From Field Desorption Microscopy to Atom Probe Tomography.- Part II Practical aspects.- 4. Specimen Preparation.- 5. Experimental protocols in Field Ion Microscopy.- 6. Experimental protocols.- 7. Tomographic reconstruction.- PART III Applying atom probe techniques for materials science.- 8. Analysis techniques for atom probe tomography.- 9. Atom probe microscopy and materials science.- Appendices.
| Erscheinungsjahr: | 2012 |
|---|---|
| Fachbereich: | Fertigungstechnik |
| Genre: | Importe, Technik |
| Rubrik: | Naturwissenschaften & Technik |
| Medium: | Buch |
| Inhalt: |
xxiv
396 S. |
| ISBN-13: | 9781461434351 |
| ISBN-10: | 1461434351 |
| Sprache: | Englisch |
| Herstellernummer: | 80096274 |
| Einband: | Gebunden |
| Autor: |
Gault, Baptiste
Ringer, Simon P. Cairney, Julie M. Moody, Michael P. |
| Hersteller: |
Springer New York
Springer US, New York, N.Y. |
| Verantwortliche Person für die EU: | Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com |
| Maße: | 241 x 160 x 27 mm |
| Von/Mit: | Baptiste Gault (u. a.) |
| Erscheinungsdatum: | 14.05.2012 |
| Gewicht: | 0,793 kg |
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