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John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
Serves as an expanded and thoroughly updated successor to the authors' 1992 "Electron Microdiffraction," the leading text in the field
Improves on previous coverage of electron wave properties and electron diffraction theory in addition to many new chapters in such areas as strain-field analysis and electron detectors
Offers comprehensive, quantitative treatments of crystal symmetry, crystal structure and bonding, diffuse scattering, strain measurements, defects and nanostructure characterization
Provides new coverage of electron optics, principles of aberration correction and energy filters, electron nanodiffraction techniques, and TEM and STEM imaging theory
Presents the latest information on nanostructure analysis, emphasizing quantitative analysis of images and diffraction patterns
Includes numerous tables and figures for electron crystallography, and source listings of simulation and modeling computer programs
Includes supplementary material: [...]
Erscheinungsjahr: | 2018 |
---|---|
Fachbereich: | Fertigungstechnik |
Genre: | Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Taschenbuch |
Seiten: | 756 |
Inhalt: |
xxvi
729 S. 92 s/w Illustr. 218 farbige Illustr. 729 p. 310 illus. 218 illus. in color. |
ISBN-13: | 9781493982493 |
ISBN-10: | 1493982494 |
Sprache: | Englisch |
Ausstattung / Beilage: | Paperback |
Einband: | Kartoniert / Broschiert |
Autor: |
Spence, John C. H.
Zuo, Jian Min |
Auflage: | Softcover reprint of the original 1st ed. 2017 |
Hersteller: |
Springer New York
Springer US, New York, N.Y. |
Maße: | 235 x 155 x 38 mm |
Von/Mit: | John C. H. Spence (u. a.) |
Erscheinungsdatum: | 23.06.2018 |
Gewicht: | 1,283 kg |
John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
Serves as an expanded and thoroughly updated successor to the authors' 1992 "Electron Microdiffraction," the leading text in the field
Improves on previous coverage of electron wave properties and electron diffraction theory in addition to many new chapters in such areas as strain-field analysis and electron detectors
Offers comprehensive, quantitative treatments of crystal symmetry, crystal structure and bonding, diffuse scattering, strain measurements, defects and nanostructure characterization
Provides new coverage of electron optics, principles of aberration correction and energy filters, electron nanodiffraction techniques, and TEM and STEM imaging theory
Presents the latest information on nanostructure analysis, emphasizing quantitative analysis of images and diffraction patterns
Includes numerous tables and figures for electron crystallography, and source listings of simulation and modeling computer programs
Includes supplementary material: [...]
Erscheinungsjahr: | 2018 |
---|---|
Fachbereich: | Fertigungstechnik |
Genre: | Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Taschenbuch |
Seiten: | 756 |
Inhalt: |
xxvi
729 S. 92 s/w Illustr. 218 farbige Illustr. 729 p. 310 illus. 218 illus. in color. |
ISBN-13: | 9781493982493 |
ISBN-10: | 1493982494 |
Sprache: | Englisch |
Ausstattung / Beilage: | Paperback |
Einband: | Kartoniert / Broschiert |
Autor: |
Spence, John C. H.
Zuo, Jian Min |
Auflage: | Softcover reprint of the original 1st ed. 2017 |
Hersteller: |
Springer New York
Springer US, New York, N.Y. |
Maße: | 235 x 155 x 38 mm |
Von/Mit: | John C. H. Spence (u. a.) |
Erscheinungsdatum: | 23.06.2018 |
Gewicht: | 1,283 kg |